Superresolution with a static Fourier-transform spectrometer by use of maximum-entropy inference

B. A. Patterson; W. Sibbett; M. J. Padgett

Conference on Lasers and Electro-Optics
OSA Technical Digest (Optica Publishing Group, 1997),
paper CTuP50

Superresolution with a static Fourier-transform spectrometer by use of maximum-entropy inference

B. A. Patterson, W. Sibbett, and M. J. Padgett

Conference on Lasers and Electro-Optics 1997

Baltimore, Maryland United States
18–23 May 1997
ISBN: 1-55752-498-8

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CLEO Poster Session: 1 (CTuP)

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B. A. Patterson, W. Sibbett, and M. J. Padgett, "Superresolution with a static Fourier-transform spectrometer by use of maximum-entropy inference," in Conference on Lasers and Electro-Optics, D. Killinger, G. Valley, C. Chang-Hasnain, and W. Knox, eds., Vol. 11 of OSA Technical Digest (Optica Publishing Group, 1997), paper CTuP50.

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Abstract

Static Fourier-transform (FT) spectrometers based on Wollaston prisms provide several advantages over conventional FT spectrometers based on a Michelson interferometer.

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