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  • Conference on Lasers and Electro-Optics
  • OSA Technical Digest (Optica Publishing Group, 1997),
  • paper CTuP48

Nonoptical tip-sample distance control for scanning near-field optical microscopy

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Abstract

A variety of mechanisms have been demonstrated for tip-sample distance regulation in scanning near-field optical microscope (SNOM).1-4

© 1997 Optical Society of America

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