Real-time depth-resolved holographic imaging using photorefractive MQW devices

R. Jones; N. P. Barry; S. C W. Hyde; J. C. Dainty; P. M. W. French; K. M. Kwolek; K. M. Kwolek; D. D. Nolte; D. D. Nolte; M. R. Melloch; M. R. Melloch

Conference on Lasers and Electro-Optics
OSA Technical Digest (Optica Publishing Group, 1996),
paper CTuK5

Real-time depth-resolved holographic imaging using photorefractive MQW devices

R. Jones, N. P. Barry, S. C W. Hyde, J. C. Dainty, P. M. W. French, K. M. Kwolek, D. D. Nolte, and M. R. Melloch

Conference on Lasers and Electro-Optics 1996

Anaheim, California United States
2–7 June 1996
ISBN: 1-55752-443-2

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Coherence and Pulsed Effects in Photorefractives (CTuK)

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R. Jones, N. P. Barry, S. C. W. Hyde, J. C. Dainty, P. M. W. French, K. M. Kwolek, D. D. Nolte, and M. R. Melloch, "Real-time depth-resolved holographic imaging using photorefractive MQW devices," in Conference on Lasers and Electro-Optics, J. Bowers, D. Miller, D. Scifres, and A. Weiner, eds., Vol. 9 of OSA Technical Digest (Optica Publishing Group, 1996), paper CTuK5.

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Abstract

The semi-insulating AlGaAs/GaAs MQW devices used were as described in Ref. 4 except that these devices did not have the highly reflecting coating but were used in transmission. Due to the very small thickness of the multiple quantum well (MQW) devices (~1 μm), they are used in the Raman-Nath regime such that the holograms are read-out with small angular separations between the zero- and first-diffracted orders. This, combined with the relatively narrow clearance between the electrodes (~1 mm), strongly impacts the system's imaging performance.

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