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Optica Publishing Group
  • Conference on Lasers and Electro-Optics
  • OSA Technical Digest (Optica Publishing Group, 1995),
  • paper CWF62

Pulsed-laser deposition and characterization of Nd:Y3AI5O12 crystalline thin films on (100) silicon substrates

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Abstract

Nd:Y3Al5O12 (YAG) thin films have been attractive for waveguide lasers, because their thin-film structures can realize optical confinement, its consequent low-threshold oscillation, and high pump/amplification. These thin-film structures have been fabricated by He implantation1 and liquid-phase epitaxy.2 Recently, pulsed-laser deposition has been studied extensively as an electronic film-growth technique for high-quality, high-Tc superconductors.3 The fabrication of optical thin films by pulsed-laser deposition is a topic of great interest. If Nd:YAG thin films could be fabricated by the method, this scheme would become much more interesting because pulsed-laser deposition would be a unique technique for in situ processing.

© 1995 Optical Society of America

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