Abstract
Advances in ultrashort-pulse laser systems have fueled the recent interest in developing practical methods to completely characterize the intensity and phase of ultrashort laser pulses. 1-3 Of these methods, only frequency-resolved optical gating1 (FROG) has been demonstrated for single-shot operation. Although FROG has been used to characterize the output of ultrafast laser systems and to determine linear and nonlinear chirp from such devices, it has not been used, to our knowledge, to measure basic materials parameters, such as χ3. In this paper, we demonstrate that FROG is a useful technique for the measurement of n2 in optical materials. An accurate determination of n2 in materials in necessary for the design of high-power laser systems.
© 1995 Optical Society of America
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