Characterization of the photorefractive property of KNSBN:Cu

H. Y. Zhang; H. M. Jiang; X. H. He; Y. H. Shih

Conference on Lasers and Electro-Optics
OSA Technical Digest (Optica Publishing Group, 1994),
paper CTuK28

Characterization of the photorefractive property of KNSBN:Cu

H. Y. Zhang, H. M. Jiang, X. H. He, and Y. H. Shih

Conference on Lasers and Electro-Optics 1994

Anaheim, California United States
8–13 May 1994
ISBN: 1-55752-341-X

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Poster Session 1 (CTuK)

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H. Y. Zhang, H. M. Jiang, X. H. He, and Y. H. Shih, "Characterization of the photorefractive property of KNSBN:Cu," in Conference on Lasers and Electro-Optics, T. Baer, A. Smirl, J. Bowers, and D. Miller, eds., Vol. 8 of OSA Technical Digest (Optica Publishing Group, 1994), paper CTuK28.

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Abstract

Cu doped (K_0.5N_0.5)_0.2 (Sr_0.75 Ba_0.25)0.9 Nb₂O₆ is newly developed photorefractive crystals.¹ Photorefractive property of KNSBN:Cu (doped with 0.1% Cu by weight) was systematically characterized from visible to near infrared region (476-810 nm) in our lab recently. The work can be divided into two parts;

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