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Optica Publishing Group
  • Conference on Lasers and Electro-Optics
  • OSA Technical Digest (Optica Publishing Group, 1994),
  • paper CThI7

Use of an actively mode-locked fiber laser for electro-optic sampling

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Abstract

Previous studies have employed electro-optic (EO) sampling1–3 to test the internal nodes of high-speed integrated circuits and devices. In order for these sampling systems to be useful commercially, compact pulse sources based on gain-switched semiconductor lasers have also been developed and evaluated.4–5

© 1994 Optical Society of America

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