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Optica Publishing Group
  • Conference on Lasers and Electro-Optics
  • OSA Technical Digest (Optica Publishing Group, 1992),
  • paper CThR5

Trace impurity effects in copper vapor lasers

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Abstract

Copper vapor lasers (CVLs) offer high-average powers in the visible (510.6 and 578 nm) with wallplug efficiencies > 1% available. CVLs have developed into a mature technology over recent years with most of their properties well understood. However, little is known of the effect of trace impurities—arising from the aluminum oxide insulating substrate (Zircar AI-30-AAH), the ceramic plasma tube or (quartz) containment vessel—on laser performance. Astadjov et al.1 and Huang et al.2 have reported increased output powers as a result of admixing small components of hydrogen to copper halide lasers and CVLs, respectively, yet the mechanisms by which this occurs remains unclear. We report experiments aimed at understanding the effects of the various trace impurities so that high output powers in commercial lasers can be maintained for longer periods and the operating lifetime of sealed-off devices extended.

© 1992 Optical Society of America

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