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Conferences > CLEO > 1991 > CWD > CWD6
  • Conference on Lasers and Electro-Optics
  • OSA Technical Digest (Optica Publishing Group, 1991),
  • paper CWD6

Optical beam coupling by electron trap polarizability gratings in Bi12SiO20

Ping Xia, J. M. C. Jonathan, J. P. Partanen, and R. W. Hellwarth

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Abstract

To realize the advantages of all-optical (holographic) measurements of the charge-transport parameters of photorefractive materials, one must take into account the fact that the (complex) optical polarizability α1 of an occupied deep trap (for an electron or a hole) may be different than the α2 of an unoccupied trap.1 By measuring the coupling between overlapping beams, we have measured the real and imaginary parts of α = α1 – α2 in three samples of widely used photorefractive materials, nominally undoped cubic n-type Bi12SiO20 (BSO).

© 1991 Optical Society of America

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