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  • Conference on Lasers and Electro-Optics
  • OSA Technical Digest (Optica Publishing Group, 1990),
  • paper CFT3

Z-scan measurements of high order optical nonlinearities in semiconductors

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Abstract

We recently reported a simple single beam experimental technique, z-scan, for measuring the sign and magnitude of nonlinear refraction.1 The z-scan is based on the self-refraction of the incident beam. Using a focused beam and keeping the pulse energy constant, the transmittance through an aperture in the far field is measured as a function of z, the sample position with respect to the focal plane.

© 1990 Optical Society of America

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