Abstract
We have developed a new contactless, noninvasive technique for the high-speed sampling of voltage waveforms on electronic devices. The method is based on the energy analysis of electrons ejected from the surface of a metallization line on the device into vacuum using an ultrashort laser pulse to stimulate the electron emission. By exploiting the multiphoton photoelectric effect, it is possible to use a visible wavelength laser.
© 1986 Optical Society of America
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