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Optical path length to frequency converting interferometer using photorefractive oscillation

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Abstract

In traditional interferometery, changes in length cause changes in fringe position at the output of an interferometer. This change in fringe position is inferred by intensity measuring detectors. The precision of these devices might thus be limited by the precision with which intensity measurements can be made. However, frequency can often be measured with much higher precision than intensity. Therefore such an interferometer is potentially more accurate than coventional interferometers.

© 1985 Optical Society of America

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