Surface profile measurement at megahertz rate

Marc Rioux

doi:10.1364/CLEO.1983.TUM5

Conference on Lasers and Electro-Optics
OSA Technical Digest (Optica Publishing Group, 1983),
paper TUM5
•https://doi.org/10.1364/CLEO.1983.TUM5

Surface profile measurement at megahertz rate

Marc Rioux

Conference on Lasers and Electro-Optics 1983

Baltimore, Maryland United States
17–20 May 1983
ISBN:

From the session
Poster Session (TUM)

Not Accessible

Your library or personal account may give you access

Get PDF
Email
Share
Get Citation
Copy Citation Text
M. Rioux, "Surface profile measurement at megahertz rate," in Conference on Lasers and Electro-Optics, G. Sincerbox, T. Li, A. Gara, and C. Giuliano, eds., OSA Technical Digest (Optica Publishing Group, 1983), paper TUM5.

Export Citation
- BibTex
- Endnote (RIS)
- HTML
- Plain Text
Citation alert
Save article

Abstract

The usual active triangulation methods^1,2 to measure surface profile consist of the following elements: light source; scanning mechanism; and position sensor.

PDF Article

More Like This

Differential Absorption Lidar Measurements of the Pressure Profile with a Trough Technique

C. Laurence Korb and Chi Y. Weng
TuC8 Optical Techniques for Remote Probing of the Atmosphere (RPA) 1983

Vertical Atmospheric Extinction Profiles Measured with Lidar

G. J. Kunz, C. W. Lamberts, and T. Bakker
ThB6 Coherent Laser Radar (CLR) 1983

Measurement of H2O Vapor Profiles Using A Solar Blind Raman Lidar

A. Salik, K. Petri, and J. Cooney
TuC7 Optical Techniques for Remote Probing of the Atmosphere (RPA) 1983

Previous Article Next Article