Far field reflection microscopy based on optical diffraction tomography

F. Drsek; G. Maire; H. Giovannini; K. Belkebir; P. Chaumet; A. Talneau; A. Talneau; A. Sentenac

doi:10.1364/BIOMED.2008.BMD57

Biomedical Optics
OSA Technical Digest (CD) (Optica Publishing Group, 2008),
paper BMD57
•https://doi.org/10.1364/BIOMED.2008.BMD57

Far field reflection microscopy based on optical diffraction tomography

F. Drsek, G. Maire, H. Giovannini, K. Belkebir, P. Chaumet, A. Talneau, and A. Sentenac

Biomedical Optics 2008

St. Petersburg, Florida United States
16–19 March 2008
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BIOMED Poster Session II (BMD)

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F. Drsek, G. Maire, H. Giovannini, K. Belkebir, P. Chaumet, A. Talneau, and A. Sentenac, "Far field reflection microscopy based on optical diffraction tomography," in Biomedical Optics, OSA Technical Digest (CD) (Optica Publishing Group, 2008), paper BMD57.

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Abstract

Optical diffraction tomography in a reflection scheme is well adapted to the study of high index contrast samples. Using diffraction models that involve multiple scattering, we compare our experimental data to the modeling predictions.

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