Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
Conferences > BGPP > 2003 > WB > WB3

Improved Fourier transform technique to determine secondorder optical nonlinearity profiles

A. Ozcan, M. J. F. Digonnet, and G. S. Kino

Not Accessible

Your library or personal account may give you access

Abstract

We report a novel Maker-fringe measurement technique to determine uniquely the nonlinearity profile of thin nonlinear materials such as poled silica, which offers a greater accuracy as well as a much simpler and faster data processing algorithm.

© 2003 Optical Society of America

PDF Article
More Like This
Simplified inverse Fourier transform technique to determine second-order optical nonlinearity profiles using a reference sample

A. Ozcan, M. J. F. Digonnet, and G. S. Kino
FC3 Optical Fiber Communication Conference (OFC) 2004

A Novel Technique to Determine Second-Order Optical Nonlinearity Profiles

A. Ozcan, M. Digonnet, and G. Kino
ThM4 Optical Fiber Communication Conference (OFC) 2003

A simple post-processing technique to improve the retrieval accuracy of second-order nonlinearity profiles

A. Ozcan, M. J. F. Digonnet, and G. S. Kino
CThJ6 Conference on Lasers and Electro-Optics (CLEO:S&I) 2004

View More...
Select as filters
Select Topics Cancel
Top
       
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.
Privacy | Terms of Use