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Conferences > BGPP > 2001 > BThA > BThA2

Defect Formation in SiO2:P2O5 Glasses by Excimer Laser Irradiation: Effects of Hydrogen Loading

Hideo Hosono, Ken-ichi Kawamura, and Masahiro Hirano

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Abstract

In 1994 Malo et al. reported that refractive index change of more than 2x10-4 is induced in phosphorus-doped SiO2 glasses after H2-loading treatment by irradiation with ArF( not KrF) excimer laser pulses. This is the first paper reporting a large index change in Ge-free SiO2 glasses. Here we examine defect formation in P-doped SiO2 glasses before and after H2-loading by excimer laser irradiation and consider the origin of the induced index change in H2-loaded specimen.

© 2001 Optical Society of America

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