Z-scan Measurement of ZnO Thin Films Using the Ultraviolet femtosecond Pulses

Yun-Pei Chan; Ja-Hon Lin; Kuei-Huei Lin; Wen-Feng Hsieh

doi:10.1364/ASSP.2008.MC47

Advanced Solid-State Photonics
OSA Technical Digest Series (CD) (Optica Publishing Group, 2008),
paper MC47
•https://doi.org/10.1364/ASSP.2008.MC47

Z-scan Measurement of ZnO Thin Films Using the Ultraviolet femtosecond Pulses

Yun-Pei Chan, Ja-Hon Lin, Kuei-Huei Lin, and Wen-Feng Hsieh

Advanced Solid-State Photonics 2008

Nara Japan
27–30 January 2008
ISBN: 1-55752-850-0

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Poster Session I (MC)

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Y. Chan, J. Lin, K. Lin, and W. Hsieh, "Z-scan Measurement of ZnO Thin Films Using the Ultraviolet femtosecond Pulses," in Advanced Solid-State Photonics, OSA Technical Digest Series (CD) (Optica Publishing Group, 2008), paper MC47.

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Abstract

Optical nonlinearities of ZnO thin films were investigated by the Z-scan technique using the ultraviolet femtosecond pulses. The TPA coefficient shows the unexpected enhancement and the γ is positive due to the thermal lensing effect.

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