Defect Density Analyze of UV High-Reflective Coating Used in the High Power Laser System

Hu Wang; Hu Wang; Hongji Qi; Weili Zhang; Yanzhi Wang; Bin Wang; Bin Wang; Meng Guo; Meng Guo

doi:10.1364/ASSL.2014.ATu2A.16

Advanced Solid State Lasers
OSA Technical Digest (online) (Optica Publishing Group, 2014),
paper ATu2A.16
•https://doi.org/10.1364/ASSL.2014.ATu2A.16

Defect Density Analyze of UV High-Reflective Coating Used in the High Power Laser System

Hu Wang, Hongji Qi, Weili Zhang, Yanzhi Wang, Bin Wang, and Meng Guo

Advanced Solid State Lasers 2014

Shanghai China
16–21 November 2014
ISBN: 978-1-55752-822-3

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Poster II (ATu2A)

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H. Wang, H. Qi, W. Zhang, Y. Wang, B. Wang, and M. Guo, "Defect Density Analyze of UV High-Reflective Coating Used in the High Power Laser System," in Advanced Solid State Lasers, OSA Technical Digest (online) (Optica Publishing Group, 2014), paper ATu2A.16.

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Abstract

A new method of analyzing defect density has been developed to assess HR coatings with the corresponding field in each layer and extract the defect distribution, independent of test condition and film structure.

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