Abstract
A novel, nontransient, light-induced grating technique to study electronic excitation migration in laser crystals is described and demonstrated.
Using this technique, the diffusion of excitations over the level 4I11/2 was studied in Cr:Er:YSGG laser crystal, a laser medium used for efficient 2.79 μm lasers for medicine and other applications.
A surprisingly long distance of migration was found. The value obtained for the diffusion coefficient, D=7×10−7 cm2s−1, was several orders of magnitude higher than that predicted from the spectroscopic analysis; possible reasons for the disagreement are discussed.
© 1995 Optical Society of America
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