The application of ANN and PLS in detecting Si, Cr and V of standard pig iron samples by LIBS

Yaguang Mei; Shusen Cheng

doi:10.1364/ASA.2017.AS4A.6

The International Photonics and Optoelectronics Meeting 2017
OSA Technical Digest (online) (Optica Publishing Group, 2017),
paper AS4A.6
•https://doi.org/10.1364/ASA.2017.AS4A.6

The application of ANN and PLS in detecting Si, Cr and V of standard pig iron samples by LIBS

Yaguang Mei and Shusen Cheng

Advanced Spectroscopy and Applications 2017

Wuhan China
3–5 November 2017
ISBN: 978-1-943580-37-8

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ASA Session I (AS4A)

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Y. Mei and S. Cheng, "The application of ANN and PLS in detecting Si, Cr and V of standard pig iron samples by LIBS," in The International Photonics and Optoelectronics Meeting 2017, OSA Technical Digest (online) (Optica Publishing Group, 2017), paper AS4A.6.

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Abstract

LIBS was employed to detect the Si, Cr and V concentration in the pig iron. To reduce the influence of matrix effect, ANN and PLS were adopted in the calibration process and compared with each other.

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