High-Dynamic Range, High-Resolution Freeform Metrology with Optical Differentiation Wavefront Sensing

B. R. Swain; C. Dorrer; S. DeFisher; J. Qiao; J. Qiao

doi:10.1364/AOMS.2020.OF4B.6

Imaging and Applied Optics Congress
OSA Technical Digest (Optica Publishing Group, 2020),
paper OF4B.6
•https://doi.org/10.1364/AOMS.2020.OF4B.6

High-Dynamic Range, High-Resolution Freeform Metrology with Optical Differentiation Wavefront Sensing

B. R. Swain, C. Dorrer, S. DeFisher, and J. Qiao

Adaptive Optics: Analysis, Methods & Systems 2020

Washington, DC United States
22–26 June 2020
ISBN: 978-1-943580-77-4

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Wavefront Sensing and Control (OF4B)

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B. R. Swain, C. Dorrer, S. DeFisher, and J. Qiao, "High-Dynamic Range, High-Resolution Freeform Metrology with Optical Differentiation Wavefront Sensing," in Imaging and Applied Optics Congress, OSA Technical Digest (Optica Publishing Group, 2020), paper OF4B.6.

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Abstract

Wavefront generated by freeform phase plate is measured with an optical differentiation wavefront sensor. Comparison of the measurement with a commercial scanning interferometer shows M0 (A=633 nm) agreement, demonstrating its potential for metrology applications.

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