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Super resolution microscopy by dual-model competition excitation

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Abstract

We report a novel method to exploit the saturated phenomenon to realize super resolution for the first time. Our technique utilizes the competition of the two fluorescence emission generated by two different modes of illumination light of the same laser source. One is modulated to generated doughnut spot with high power to induce saturated effect, the other is unsaturated and modulated at a certain frequency. By demodulating the emission intensity of fluorophore, we achieve a narrowed PSF indirectly. We have faith to experimentally achieve at least a resolution of λ/4 in the far-field by the dual-mode competition excitation microscopy.

© 2016 Optical Society of America

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