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Conferences > AIO > 2016 > AITh4A > AITh4A.2

Watching paint dry and other exciting processes monitored by thin-film-interferometry

John E. Saunders, Hao Chen, Connor Sanders, Chris Brauer, McGregor Clayton, Jack A. Barnes, and Hans-Peter Loock

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Abstract

We describe a simple large-angle interferometer that permits the independent measurements of thickness and refractive index of films in the 20-200 micron thickness range at a 10Hz data acquisition rate.

© 2016 Optical Society of America

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