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AOTF Reflectance Spectroscopy: A Diagnostic of Organically Modified Surfaces

Rula Tawalbeh, David Voelz, David Glenar, Xifeng Xiao, and Nancy Chanover

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Abstract

A compact AOTF-based point spectrometer that operates at room temperature is described for measuring reflectance spectra over the 1.7 to 3.4 µm range. Its purpose is to provide “quick look” in situ detection of organically modified surfaces. Spectra are presented for a laboratory prototype.

© 2010 Optical Society of America

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