Full-Vectorial Analysis of Bending Silicon Wires by Using an Improved Finite-Difference Method

Jinbiao Xiao; Xiaohan Sun

doi:10.1364/ACPC.2012.AF4A.15

Asia Communications and Photonics Conference
OSA Technical Digest (online) (Optica Publishing Group, 2012),
paper AF4A.15
•https://doi.org/10.1364/ACPC.2012.AF4A.15

Full-Vectorial Analysis of Bending Silicon Wires by Using an Improved Finite-Difference Method

Jinbiao Xiao and Xiaohan Sun

Asia Communications and Photonics Conference 2012

Guangzhou China
7–10 November 2012
ISBN: 978-1-55752-957-2

From the session
Poster Session I (AF4A)

Not Accessible

Your library or personal account may give you access

Get PDF
Email
Share
Get Citation
Copy Citation Text
J. Xiao and X. Sun, "Full-Vectorial Analysis of Bending Silicon Wires by Using an Improved Finite-Difference Method," in Asia Communications and Photonics Conference, OSA Technical Digest (online) (Optica Publishing Group, 2012), paper AF4A.15.

Export Citation
- BibTex
- Endnote (RIS)
- HTML
- Plain Text
Citation alert
Save article

Abstract

An improved finite-difference scheme in a local cylindrical coordinate system is proposed for full-vectorial analysis of bending silicon wires. Both the complex effective indexes and field distributions of the leaky modes are presented.

PDF Article

More Like This

Vectorial Analysis of Optical Dielctric Waveguide Bends using Finite-Difference Method

Sangin Kim and Anand Gopinath
IMB2 Integrated Photonics Research (IPR) 1996

Design of Single Mode LiNbO3 Photonic Wires and Estimation of its Bending Losses for Different Bending Radii

Pranabendu Ganguly
MPo.18 International Conference on Fibre Optics and Photonics (Photonics) 2012

Full-Vectorial Finite-Difference Scheme for the Analysis of Layered Structures

Cheng-Han Du and Yih-Peng Chiou
IMC5 Integrated Photonics Research, Silicon and Nanophotonics (IPR) 2011

Previous Article Next Article