Numerical analyses of all-optical gate switches using cascaded second-order nonlinear effect in periodically poled lithium niobate devices: effects of device fabrication errors

Yutaka Fukuchi; Shun Tasaki

doi:10.1364/ACP.2010.79870R

Optoelectronic Materials and Devices V
Proceedings of SPIE-OSA (Optica Publishing Group, 2010),
paper 79870R
•https://doi.org/10.1364/ACP.2010.79870R

Numerical analyses of all-optical gate switches using cascaded second-order nonlinear effect in periodically poled lithium niobate devices: effects of device fabrication errors

Yutaka Fukuchi and Shun Tasaki

Asia Communications and Photonics Conference and Exhibition 2010

Shanghai China
8–12 December 2010
ISBN: 9780819485557

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Y. Fukuchi and S. Tasaki, "Numerical analyses of all-optical gate switches using cascaded second-order nonlinear effect in periodically poled lithium niobate devices: effects of device fabrication errors," in Optoelectronic Materials and Devices V, F. Koyama, S. Chuang, G. Duan, and Y. Huang, eds., Vol. 7987 of Proceedings of SPIE-OSA (Optica Publishing Group, 2010), paper 79870R.

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Abstract

We numerically calculate the switching performance of all-optical ultra-fast gate switches employing the cascade of second harmonic generation and difference frequency mixing in periodically poled lithium niobate devices. In the analyses, the device fabrication errors are considered. We show that the domain length error decreases the switching efficiency significantly.

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