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The electrical properties of the diamond optoelectronic device

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Abstract

200 µm thick free-standing polycrystalline diamond films were grown by microwave plasma chemical vapor deposition (MPCVD) method. The nucleation surfaces of diamond were characterized by XRD, Raman scattering, atomic force microscopy (AFM) method. An ultraviolet (UV) optoelectronic device was fabricated on diamond nucleation surface, showing clear modulation of channel current.

© 2009 OSA, IEEE Photonics Society, SPIE, COS, CIC

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