Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

DLAS-based measurement of water film thickness in retro-reflection

Not Accessible

Your library or personal account may give you access

Abstract

A dual-wavelength diode laser absorption spectroscopy (DLAS)-based sensor makes use of a retro-reflective foil as scattering target and time-division multiplexing (TDM) to enable remote measurements of the water film thickness in the 50–1000 µm range.

© 2016 Optical Society of America

PDF Article
More Like This
Water Film Thickness Imaging based on Time-Multiplexed Near-Infrared Absorption

Marc Lubnow, Thomas Dreier, and Christof Schulz
LW2C.3 Laser Applications to Chemical, Security and Environmental Analysis (LACSEA) 2018

Diode Laser Based Film Thickness Measurement of DEF

Anna Schmidt, Benjamin Kühnreich, Hannah Kittel, Cameron Tropea, Ilia V. Roisman, Andreas Dreizler, and Steven Wagner
LM3C.3 Laser Applications to Chemical, Security and Environmental Analysis (LACSEA) 2018

Thickness imaging of evaporating liquid water films by simultaneous Tracer-LIF, Raman imaging and Diode Laser Absorption Spectroscopy

D. Greszik, H. Yang, T. Dreier, and C. Schulz
LT3B.2 Laser Applications to Chemical, Security and Environmental Analysis (LACSEA) 2012

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved