Division of Optoelectronics, Electronics and Electrical Engineering Laboratory, National Institute of Standards and Technology, Boulder, Colorado 80303 USA
W. C. Swann and S. L. Gilbert, "Pressure-induced shift and broadening of 1510–1540-nm acetylene wavelength calibration lines," J. Opt. Soc. Am. B 17, 1263-1270 (2000)
We have measured the pressure-induced shift for 15 lines of the rotational–vibrational band of acetylene These lines are useful as wavelength references in the 1510–1540-nm region. We find that the pressure shift varies from +0.008(2) pm/kPa for line to +0.043(2) pm/kPa for line with many of the lines exhibiting a shift near +0.017 pm/kPa (or, equivalently, or -0.29 MHz/Torr). In addition, we have measured the pressure broadening of these lines and find that it also varies with line number and is typically ∼0.7 pm/kPa (∼12 MHz/Torr). We also evaluate the line sensitivity to temperature changes and electromagnetic fields.
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
You do not have subscription access to this journal. Article tables are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
This uncertainty budget was used for the determination of relative line centers for the low-, intermediate-, and high-pressure cells. The combined standard uncertainties are the root SS of the standard uncertainties due to the sources listed. The absolute accuracy of the wavelength meter is not included.
Pressure shift results obtained from the two cell pairs for the measured lines of the band of acetylene are shown. The uncertainties in the final digits of the values are indicated in parentheses. For the data in columns 2–5, all the values in a particular column have the uncertainty listed for the first value in the column. The uncertainties quoted are the expanded uncertainties obtained by use of a coverage factor (i.e., our quoted uncertainty is ±2σ).
Line center results for very-low-pressure conditions (less than 5 Pa). Our measurements (column 2) are values obtained by use of line centers at the different pressures extrapolated to zero pressure. Our expanded uncertainty for each line center is (0.1 pm). The data in column 3 are from Ref. 3, measured at very low pressure with an estimated uncertainty of
Width of the Lorentzian component of the Voigt line profile derived from fitting the lines with the Gaussian component, which is due is Doppler broadening, fixed at 3.7 pm. Results were obtained at the three pressures for selected lines of the band of acetylene All the values in a column have the expanded uncertainty (coverage factor of 2) listed for the first value in the column.
This uncertainty budget was used for the determination of relative line centers for the low-, intermediate-, and high-pressure cells. The combined standard uncertainties are the root SS of the standard uncertainties due to the sources listed. The absolute accuracy of the wavelength meter is not included.
Pressure shift results obtained from the two cell pairs for the measured lines of the band of acetylene are shown. The uncertainties in the final digits of the values are indicated in parentheses. For the data in columns 2–5, all the values in a particular column have the uncertainty listed for the first value in the column. The uncertainties quoted are the expanded uncertainties obtained by use of a coverage factor (i.e., our quoted uncertainty is ±2σ).
Line center results for very-low-pressure conditions (less than 5 Pa). Our measurements (column 2) are values obtained by use of line centers at the different pressures extrapolated to zero pressure. Our expanded uncertainty for each line center is (0.1 pm). The data in column 3 are from Ref. 3, measured at very low pressure with an estimated uncertainty of
Width of the Lorentzian component of the Voigt line profile derived from fitting the lines with the Gaussian component, which is due is Doppler broadening, fixed at 3.7 pm. Results were obtained at the three pressures for selected lines of the band of acetylene All the values in a column have the expanded uncertainty (coverage factor of 2) listed for the first value in the column.